Our Products

Designed with Electron Microscopists in mind…

Developed with experienced electron microscopists, our EM products are designed for reliability and ease of use. Each product is made to order and can be fitted by our team of expert microscopy engineers.

Probe Current Meter

Our probe current meter has been designed with electron beam lithography, ion beam and EDX users in mind. Battery operated, it can measure down to 1pA with no interference from surrounding instruments.

Key Features

  • Capable of long term stability for EBL, FIB and EDX applications
  • Battery version available for portable applications
  • ╬╝A-pA range
  • Installed in seconds subject to appropriate connector

Beam Blankers

We make both electromagnetic and electrostatic beam blankers for electron microscope columns.

Key Features

  • Electrostatic or Electromagnetic
  • Fast and reliable
  • Specialised electronics can be tailored to suit individual applications

Take a look at our range of refurbished and upgraded electron microscopes 

EM Systems Support Ltd

Media House
SK10 4NL

Tel: +44 (0) 1625 813730

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