We provide a range of products either developed for the needs of our customers or supplied by one of our commercial agencies or partners.

Probe Current Meter

Developed with Electron Beam Lithography, Ion Beam and EDX users in mind.

Chamber View

An infra red remote viewing system with many applications, from Electron Microscope specimen chambers to experimental observations.

Beam Blankers

 

Both electromagnetic and electrostatic systems for E M columns

 

Electron Beam Lithography Systems -            

                                                                                    

        Raith GmbH EBL systems from entry level to complete pre qualified tools 2, 6 and 8inch systems available.

        Nanofabrication and engineering work stations - 

Ion Beam Milling Systems.               

        High resolution systems available from Orsay Physics as complete solutions.     

Preparation Systems and Devices.     

        Highest quality preparation equipment and accessories from Bal-Tec AG.

 Micro Focused x-ray  Systems for SEM.         

           Micro x-ray fluorescence in the SEM for high sensitivity analysis of trace elements