Here we will periodically give the latest information on our company and other items of interest
Please have a look at the two new products available from BAL-TEC by clicking on the tab.
Development of BAL-TEC's HPM techniques, has lead to the introduction of the HPM100
A new Triple Ion Beam Milling tool, also now available the TIC020
The Raith 150-TWO
Have a look at the Raith Tab and see the new version of the world class Raith 150
Micro x-ray fluorescence,
giving you enhanced sensitivity for trace analysis
- deeper information depth for coating analysis
- improved accuracy by combining EPMA (electron probe microanalysis)
and XRF results
Application notes available at www.ifg-adlershof.de
We welcome your enquiries on these instruments
suppliers of systems and devices for the Electron Microscopy world.
Please call for more information or specific enquiries.
If you have existing Bal-Tec equipment, we can now assist you
with your service requirements and consumables
USER MEETING - Check at Raith web site
E M Systems Support Ltd
Systems, in stock which we have available (subject to prior sale)
please visit regularly as
Cambridge
Philips
Hitachi
JEOL
EDX systems
Sputter coaters
Variety of x-ray detectors
VCR Dimpler
LKB Knifemaker
Digital Image capture systems
Probe current meters
Infrared chamber viewers
Variety of SEM TEM and STEM spares incl HT tanks specimen holders (e.g. Philips/JEOL TEM tilt rod / multi-specimen holders)
Please ask us for what you need - if we don't have it we probably know someone who has !!
Coverage of E M Systems Support
We can be found a several exhibitions / conferences during the year
Raith GmbH advertise in the above European edition and in Semiconductor International
Ask for details of our next venue? chris@emsys.co.uk